Post-Silicon Debug for RISC-V Platforms: Reports and Metrics

BEFORE / AFTER TREND - Post-Silicon Debug for RISC-V Platforms

First-failure isolation time, reproducibility rate of silicon issues, and escaped-defect trend after debug closure.
  ^
  |                           o target band
  |                    o after fix + reruns
  |             o
  |      o baseline (failing)
  +--------------------------------------------------> iteration
       capture issue      isolate mechanism      close + monitor

Use this view to confirm the gain is causal and stable across seeds.

ROOT CAUSE TREE - Post-Silicon Debug for RISC-V Platforms

First-failure isolation time, reproducibility rate of silicon issues, and escaped-defect trend after debug closure. regressed
          |
   reproducible on fixed seed?
      /                 \
    no                   yes
    |                     |
env/tool drift       first failing domain?
                     /        |         \
                  decode    execute    memory/MMU
                    |         |            |
               control map  bypass/FU   TLB/walk/perm
                    |
         privilege/CSR side effects checked?

Stop at first confirmed mechanism, then assign explicit owner + fix proof.