RISC-V Design · All levels
Post-Silicon Debug for RISC-V Platforms: Design Space
Design Space for Post-Silicon Debug for RISC-V Platforms.
Design space
Design Space for Post-Silicon Debug for RISC-V Platforms is anchored on First-failure isolation time, reproducibility rate of silicon issues, and escaped-defect trend after debug closure.. Convert observations into mechanism-backed decisions with explicit ownership.
Trade latency and throughput against power and area.
Prefer architecture options with clear software contract impact.
Quantify extension-profile cost before enabling by default.
Keep bring-up and validation ownership explicit.
Trend lens
diagram
BEFORE / AFTER TREND - Post-Silicon Debug for RISC-V Platforms
First-failure isolation time, reproducibility rate of silicon issues, and escaped-defect trend after debug closure.
^
| o target band
| o after fix + reruns
| o
| o baseline (failing)
+--------------------------------------------------> iteration
capture issue isolate mechanism close + monitor
Use this view to confirm the gain is causal and stable across seeds.