RISC-V Design · All levels
Register Conventions and Calling Discipline: Silicon PPA Impact
Silicon PPA Impact for Register Conventions and Calling Discipline.
Silicon PPA impact
Silicon PPA Impact for Register Conventions and Calling Discipline is anchored on Function-call overhead (instructions per call), spill/reload rate, and ABI conformance pass rate in integration tests.. Convert observations into mechanism-backed decisions with explicit ownership.
Frequency gains that increase bubbles may lose net throughput.
Area growth from extension logic must justify workload value.
Power and thermal stability are release gates, not secondary metrics.
PPA trend view
diagram
BEFORE / AFTER TREND - Register Conventions and Calling Discipline
Function-call overhead (instructions per call), spill/reload rate, and ABI conformance pass rate in integration tests.
^
| o target band
| o after fix + reruns
| o
| o baseline (failing)
+--------------------------------------------------> iteration
capture issue isolate mechanism close + monitor
Use this view to confirm the gain is causal and stable across seeds.